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Summary
Selected high-purity natural quartz is processed through procedures such as purification, high-temperature melting, ultrafine grinding, precise grading, and surface treatment.
Feature
High purity, excellent thermal stability, and superior weather resistance; low coefficient of thermal expansion, comprehensive granule distribution; low dielectric constant and dielectric loss, suitable for electronic materials of M6 grade and below.
Function
High-speed and high-frequency copper-clad laminate, powdered coating.
| L Series | ||||
| Typical Physical Data | Test Item | Unit | Typical Value | Test Method |
| D50 | μm | 0.8~9.7 | Laser PSA | |
| D99 | μm | 1.7~36.9 | ||
| εr | —— | 3.9~3.9 | Paraffin Compression Method | |
| tanδ | —— | 0.001~0.002 | ||
| CTE | ppm/℃ | 0.5 | Theoretical Value | |
| Typical Chemical Data | SiO2 | % | 99.5 | XRF |
Summary
Selected high-purity natural quartz is processed through procedures such as purification, high-temperature melting, ultrafine grinding, precise grading, and surface treatment.
Feature
High purity, excellent thermal stability, and superior weather resistance; low coefficient of thermal expansion, comprehensive granule distribution; low dielectric constant and dielectric loss, suitable for electronic materials of M6 grade and below.
Function
High-speed and high-frequency copper-clad laminate, powdered coating.
| L Series | ||||
| Typical Physical Data | Test Item | Unit | Typical Value | Test Method |
| D50 | μm | 0.8~9.7 | Laser PSA | |
| D99 | μm | 1.7~36.9 | ||
| εr | —— | 3.9~3.9 | Paraffin Compression Method | |
| tanδ | —— | 0.001~0.002 | ||
| CTE | ppm/℃ | 0.5 | Theoretical Value | |
| Typical Chemical Data | SiO2 | % | 99.5 | XRF |